Dongguan Tianchi Optical Equipment Co., Ltd.

# #The new r&r is developed based on r's wafer measurement system and adopts the company's advanced design and technology.
, the new r includes many configurable options to make the device more versatile, durable and reliable.
# #> Extended Z-axis range & .,
Transillumination
Complete electronic plotting & fully compliant and standard
Ergonomic operator console with concealed Keyboard tray, height and angle adjustable control panel and monitor, compliant
Fully automatic microscope, all settings computer controlled
Resolution pixel camera
(&) Wide range of measurable components, optional Import as well as complete geometric dimensioning and tolerance import.
&Wafer and Metrology Software& Important dimensions and overlay measurement of wafers, slider B, photomasks and flat panel displays.
Standard optional
,,Z-stroke ():
Load capacity:
=(.+/)
Zr =(.) ( )
Resolution:. Micron field of view measurement r and repeatability:. & ( ) DC servo motor drive